Atomic force microscopy (AFM) is a high-resolution imaging technique that provides topographical and mechanical information about surfaces at the nanoscale by utilizing a sharp tip that interacts with the sample's surface.
Overview
Components Of An AFM
Principle Of Operation
Types Of AFM Techniques
Advantages And Limitations
Future Developments In AFM
Education And Resources On AFM
Sample Preparation And Imaging
Applications Of Atomic Force Microscopy
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Gerd Binnig
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โ๏ธ The forces measured in AFM include van der Waals, electrostatic, and magnetic forces.
๐ Quantitative data, such as force measurements and mechanical properties, can be derived from AFM imaging.
๐งฌ AFM can be used to study biomolecules and their interactions at the molecular level.
๐ฌ Atomic force microscopy (AFM) allows for imaging, measuring, and manipulating materials at the nanoscale.
๐ AFM can achieve resolutions down to a few nanometers, surpassing traditional optical microscopy.
๐ AFM is widely used in fields such as material science, biology, and nanotechnology.
๐ ๏ธ The technique utilizes a sharp tip mounted on a cantilever that interacts with the surface of a sample.
๐ AFM can be operated in different modes, including contact, non-contact, and tapping modes.
๐ก Unlike electron microscopy, AFM does not require a vacuum or special sample preparation.
๐ AFM provides topographical maps of surfaces, giving insights into material properties.